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MicroSDF: Microfacet-Driven Hybrid Neural SDFs for Mixed-Reflectance Surface Reconstruction

Lejia Ye, Yuhua Xu, Yulan Guo, Lian Xu, Xiaohu Zhang

Latestcs.CLcs.LGcs.AIcs.CV
arXiv ID
2610.19681 v1
Category
Submitted
2026-10-14

Abstract

Accurate 3D reconstruction in real-world environments remains a significant challenge due to the coexistence of reflective and non-reflective surfaces, which pose distinct modeling demands. Existing methods often treat these surface types separately, limiting their generalizability and physical plausibility. To bridge this gap, we propose MicroSDF, a novel neural implicit framework that facilitates geometry and reflectance modeling through microfacet theory. Our approach incorporates three core innovations: (i) a microfacet-guided geometry model that extracts multi-scale surface normals (macroscopic and microfacet) from a signed distance field (SDF), regularized by a proposed microfacet normal consistency loss to enforce physically plausible surface orientations; (ii) an enhanced dual-branch color model, where the specular branch leverages the microfacet normals to model high-frequency reflectance, and the vanilla branch, unlike prior works, uses reflection direction (instead of viewing direction) to better model diffuse and low-frequency specular components; and (iii) a detection-guided color blending strategy that adaptively fuses the color outputs based on reflection priors, providing more physically intuitive blending than implicitly learned blending weights. Combined with a tailored multi-stage optimization scheme, the proposed MicroSDF achieves robust and high-fidelity reconstruction across reflective and non-reflective surfaces. Extensive experiments on DTU, Shiny Blender, Ref-NeRF, and DeepVoxels datasets demonstrate state-of-the-art performance, establishing a new direction for physically grounded neural reconstruction.

Comment: Published in IEEE Transactions on Image Processing, vol. 35, pp. 4106-4121, Apr. 2026. DOI: 10.1109/TIP.2026.3678096

Journal: IEEE Transactions on Image Processing, vol. 35, pp. 4106-4121, 2026

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